Ngesikhathi sokukhiqizwa kwesibonisi sephaneli eyisicaba (i-FPD), kwenziwa izivivinyo zokuhlola ukusebenza kwamaphaneli kanye nezivivinyo zokuhlola inqubo yokukhiqiza.
Ukuhlola ngesikhathi senqubo ye-array
Ukuze kuhlolwe umsebenzi wephaneli enqubweni ye-array, ukuhlolwa kwe-array kwenziwa kusetshenziswa umhloli we-array, i-array probe kanye neyunithi ye-probe. Lokhu kuhlolwa kuklanyelwe ukuhlola ukusebenza kwezifunda ze-TFT array ezenzelwe amaphaneli kuma-substrate engilazi kanye nokuthola noma yiziphi izintambo noma ama-shorts aphukile.
Ngesikhathi esifanayo, ukuze kuhlolwe inqubo enqubweni ye-array ukuze kuhlolwe impumelelo yenqubo kanye nokuphendula ngenqubo yangaphambilini, kusetshenziswa umhloli wepharamitha ye-DC, i-TEG probe kanye neyunithi ye-probe ekuhlolweni kwe-TEG. (“TEG” imele i-Test Element Group, kufaka phakathi ama-TFT, izinto ze-capacitive, izinto ze-wire, nezinye izinto zesekethe ye-array.)
Ukuhlolwa Kwenqubo Yeyunithi/yeModule
Ukuze kuhlolwe umsebenzi wephaneli enqubweni yenqubo yeseli kanye nenqubo yemojuli, kwenziwe ukuhlolwa kokukhanyisa.
Iphaneli iyavulwa futhi ikhanyiswe ukuze ibonise iphethini yokuhlola ukuhlola ukusebenza kwephaneli, amaphutha ephuzu, amaphutha omugqa, i-chromaticity, i-chromatic aberration (ukungalingani), ukuqhathanisa, njll.
Kunezindlela ezimbili zokuhlola: ukuhlolwa kwephaneli ebonakalayo yomqhubi kanye nokuhlolwa kwephaneli okuzenzakalelayo kusetshenziswa ikhamera ye-CCD eyenza ngokuzenzakalelayo ukutholwa kwamaphutha kanye nokuhlolwa kokupasa/ukwehluleka.
Abahloli bamaseli, ama-probe amaseli kanye namayunithi e-probe asetshenziswa ukuhlola.
Ukuhlolwa kwemodyuli kusebenzisa nohlelo lokuthola i-mura kanye nokubuyisela oluthola ngokuzenzakalelayo i-mura noma ukungalingani esibukweni futhi luqede i-mura ngesinxephezelo esilawulwa ukukhanya.
Isikhathi sokuthunyelwe: Jan-18-2022