Isimo se-metrology yezimboni kanye nokuhlaziywa kwesayensi sidlula ekuguqukeni okukhulu. Njengoba ama-semiconductor eba maningi kakhulu futhi isayensi yezinto ingena endaweni yama-athomu, imishini esetshenziswa ukuhlola lokhu kuthuthuka kumele ihlangabezane nezinga elingakaze libonwe lokuzinza ngokomzimba. Ekwakhiweni kokusebenza okuphezulu.Imishini yokuhlola indawokanye namathuluzi okuhlaziya ayinkimbinkimbi, isisekelo sesakhiwo asisacatshangwa kamuva—siyisithiyo esiyinhloko ekusebenzeni. Kwa-ZHHIMG, sibonile ukuthi ukuguquka kusuka kuzimele zensimbi zendabuko kuya ezakhiweni ze-granite ezihlanganisiwe kuyisici esichazayo sama-OEM ahlose ukufeza ukunemba kwe-sub-micron ezingxenyeni zemishini ze-Automated Optical Inspection kanye nezinhlelo zezithombe ezibucayi.
Ukushisekela ukukhiqizwa okungenasici embonini ye-elekthronikhi kubeke ingcindezi enkulu ezinhlelweni ze-Automated Optical Inspection (AOI). Le mishini kumele icubungule izinkulungwane zezingxenye ngomzuzu, ngamakhamera anesinqumo esiphezulu ahamba ngesivinini esikhulu futhi ame ngokushesha ukuze athwebule izithombe. Le ndlela yokusebenza idala amandla amakhulu e-kinetic angaholela ekubonakaleni kwesakhiwo. Ngokusebenzisa i-granite kwezingxenye eziyinhloko zemishini ye-Automated Optical Inspection, onjiniyela bangasebenzisa ubukhulu bemvelo obuphezulu kanye nezakhiwo zangaphakathi zokudambisa. Ngokungafani nensimbi, engadlidliza ama-millisecond ngemuva kokuma ngesivinini esikhulu, i-granite imunca lawa ma-micro-oscillations cishe ngokushesha. Lokhu kuvumela izinzwa ze-AOI ukuthi zihlale ngokushesha, zikhulisa ngqo ukuphuma kanye nokuthembeka kwenqubo yokuhlola ngaphandle kokuphazamisa ukunemba.
Ngaphezu kwalokho, njengoba singena emkhakheni wokuhlola okungonakalisi kanye nokuhlaziywa kwekristalu, izidingo ziba nzima nakakhulu. Ezweni lekristalu, i-Isisekelo somshini wokusabalalisa i-X-raykumele inikeze indiza yokubhekisela ecishe iphelele. I-X-ray diffraction (XRD) incike ekulinganisweni okunembile kwama-engeli lapho i-X-ray iphambukiswa khona yisampula. Ngisho nokuphambuka kwemizuzwana embalwa ye-arc okubangelwa ukwanda kokushisa kwesisekelo somshini kungenza idatha ingasebenzi. Yingakho kanyeisisekelo se-granite se-X-ray diffractionsekuyindlela ejwayelekile embonini yezinsimbi ezisezingeni lelebhu. I-coefficient ephansi kakhulu yokwanda kokushisa kwe-granite emnyama iqinisekisa ukuthi ubudlelwano bendawo phakathi komthombo we-X-ray, umnikazi wesampula, kanye nomtholi buhlala bunjalo, kungakhathaliseki ukushisa okukhiqizwa yizingxenye ze-elekthronikhi noma ukushintsha kwezinga lokushisa elizungezile elebhu.
Ukusetshenziswa kwe-granite emishinini yokuhlola i-Surface kudlulela ngale nje kokudambisa ukudlidliza. Ku-metrology yesimanje ye-surface—lapho ama-laser profiler kanye nama-interferometer okukhanya okumhlophe kusetshenziswa khona ukudweba i-topography yama-silicon wafers noma ama-lens optical—ukuthamba kwendawo ebhekisele kuyo “kungumkhawulo weqiniso.” Isisekelo se-granite se-ZHHIMG se-X-ray diffraction noma ukuskena kwendawo sihlanganiswe ngendlela ebekezelela kakhulu kangangokuthi sinikeza “iphuzu eliyi-zero” elizinzile kuyo yonke imvilophu yokusebenza. Lokhu kuthamba okungokwemvelo kubalulekile ezigabeni zokuthwala umoya ezivame ukutholakala kule mishini. Isimo esingenazo izimbobo futhi esifanayo se-granite emnyama esezingeni eliphezulu sivumela ifilimu yomoya ehambisanayo, okuvumela ukunyakaza okungenazingxabano okudingekayo ezindaweni zokuskena esikalini se-nanometer.
Ngale kokusebenza kobuchwepheshe, ukuhlala isikhathi eside kwe-granite ezindaweni zezimboni kunikeza inzuzo enkulu kwezomnotho kuma-OEM aseYurophu naseMelika. Emjikelezweni wokuphila kwengxenye ye-Imishini yokuhlola indawo, uhlaka lwemishini luvame ukuba yilona kuphela ingxenye engenakuthuthukiswa kalula. Ngenkathi amakhamera, isofthiwe, kanye nezinzwa zishintsha njalo eminyakeni embalwa, isisekelo somshini we-X-ray diffraction noma i-AOI chassis kumele sihlale sizinzile ngokwesilinganiso iminyaka eyishumi noma ngaphezulu. I-Granite ayigqwali, ayihlushwa ukucindezeleka kwangaphakathi ngokuhamba kwesikhathi, futhi imelana nomhwamuko wamakhemikhali ovame ukutholakala emakamelweni okuhlanza e-semiconductor. Lokhu kuqinisekisa ukuthi ukutshalwa kwezimali kokuqala ezingxenyeni zemishini ze-Automated Optical Inspection ezisezingeni eliphezulu kukhokha izinzuzo ngendlela yokunakekelwa okuncishisiwe kanye nokuzinza kokulinganisa isikhathi eside.
Kwa-ZHHIMG, indlela yethu yokukhiqiza lezi zingxenye ezibalulekile ihlanganisa ukukhetha okuhle kakhulu kwezinto zemvelo nobunjiniyela obusezingeni eliphezulu bokunemba. Siyaqonda ukuthi isisekelo segranite sokusabalalisa kwe-X-ray singaphezu nje kwetshe; siyingxenye yomshini elinganisiwe. Inqubo yethu ihilela ukuguga kwezinto okuqinile kanye nokugoqa ngesandla ochwepheshe abangochwepheshe ukuze bafinyelele imininingwane yeBanga 00 noma yeBanga 000. Ngokuhlanganisa izinto ezifakiwe ezinentambo enembile kanye nemigwaqo yekhebula eyenziwe ngokwezifiso ngqo kugranite, sinikeza isisombululo sesakhiwo "sokuxhuma nokudlala" esivumela abakhiqizi bemishini ukuthi bagxile ezintweni zabo eziyinhloko zokukhanya kanye neze-elekthronikhi.
Ekuphetheni, ikusasa lokuhlola ngokunemba lakhelwe ekuzinzeni kwesisekelo. Kungakhathaliseki ukuthi yindawo yomlilo osheshayo yemishini yokuhlola i-Surface emgqeni wokukhiqiza noma izidingo ezithule neziqinile zelebhu.Isisekelo somshini wokusabalalisa i-X-ray, i-granite isalokhu iyisinqumo esingenakuqhathaniswa. Ngokukhetha i-ZHHIMG njengomlingani wezingxenye zemishini ze-Automated Optical Inspection, abakhiqizi abakhethi nje umhlinzeki—baqinisekisa ubuqotho besakhiwo obuzochaza isizukulwane esilandelayo sentuthuko yesayensi neyezimboni.
Isikhathi sokuthunyelwe: Jan-15-2026